Join PTP at NI-Days - 9th November

Posted by Rachel Wood on 13 October 2011 | 2 Comments

Tags: NI, National Instruments, NI Days, PTP, LabVIEW, Test, Measurement

 PTP are delighted to be exibiting again at NIDays 2011 in London - the UK's leading graphical system design conference and exhibition.  At this free one-day conference, you can join a thriving community of fellow innovators, educators, engineers, scientists and NI developers to explore the latest technologies to help you increase productivity and improve your efficiency.  NIDays 2011 offers 12 tracks of hands-on training, in-depth technical sessions on the latest NI products and a large exhibition floor.

Visit our stand in the exhibition area to talk to one of our NI Certified Developers about any Test, Measurement, Control & Instrumentation projects you may have.  Thomas the Tank Engine will also be puttting in an appearance on our stand!  Curious?  Then don\'t forget to register for your FREE place via National Instruments - simply call UK 01635 572498, email [email hidden] or visit http://uk.ni.com/nidays

2011 Conference Highlights include:

Keynote: Engineering the Olympics, Louise Hardy, Infrastructure Director, CLM – Delivery Partner to the Olympic Delivery Authority

Software Development: NIDays 2011 features a complete track dedicated to software development for measurement and control applications and delivered by Certified LabVIEW Architects. Explore the latest NI software, including LabVIEW 2011, and ways to improve your productivity, performance and application stability.

Embedded Control and Monitoring: Gain an understanding of how to integrate measurements and control into an embedded device. Explore how, through abstracting complexity, NI tools fuel innovation by simplifying development, increasing productivity and reducing time-to-market.

Automated Test and Data Acquisition: Learn about new and advanced hardware and software tools for automated test, including real-time and
FPGA technology. Also, understand the common templates for measurement applications and how to apply them.

RF and Wireless Summit: Learn about next generation RF and wireless test technology and listen to top industry experts as they explain wireless trends, emerging instrumentation technologies and innovative test techniques. Also, gain a better understanding of a range of topics including measurement speed, software-defined radio and linking RF design and test.

Academic Summit: The Academic Summit provides a platform for academic professionals to share best practices in engineering education methods, discuss the future of engineering and network with colleagues. View presentations from experts in engineering application areas, and learn how they integrate NI solutions to reinforce concepts and bring learning objectives to life.

Hands-On Sessions: The conference features 30 hours of hands-on sessions, showcasing LabVIEW 2011, PXI and modular instruments, NI CompactDAQ, LabVIEW FPGA, CompactRIO, DIAdem, FlexRIO, AWR tools, Multisim, myDAQ, NI ELVIS and robotics.
You can pre-register for Hands-On Sessions at http://sine.ni.com/nievents/app/offering/p/offeringId/399460/site/nie/country/uk/lang/en

Download Agenda and read all session descriptions at http://uk.ni.com/nidays

You can also sign up to take the free Certified LabVIEW Associate Developer (CLAD) examination or Certified LabVIEW Developer Exam Preparation Class during the conference. Places are limited, so book now http://sine.ni.com/nievents/app/offering/p/offeringId/399460/site/nie/country/uk/lang/en

Date and location: Wednesday 9th November, The Queen Elizabeth II, Conference Centre, London

Cost: FREE!